二硫化鉭晶體(1T) TaS2(Tantalum Sulfide) -1T

　　晶體尺寸 8毫米

　　電學性能：半導體，電荷密度波（CDW），Mott相

　　晶體結構：六邊形

　　晶胞參數：a = b = 0.336 nm, c = 0.590 nm, α = β = 90°, γ = 120°

　　晶體類型：合成

　　晶體純度：＞99.995%

　　X-ray diffraction on a Tantalum Disulfide single crystal aligned along the (001) plane. XRD on the 1T-TaS2 was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 1, 2, 3, 4, 5

　　Powder X-ray diffraction (XRD) of a single crystal 1T-TaS2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.

　　Stoichiometric analysis of a single crystal 1T-TaS2 by Energy-dispersive X-ray spectroscopy (EDX).