二硫化錸晶體 ReS2 (Rhenium Disulfide)

　　晶體結構：三斜晶晶體尺寸 8毫米

　　電學性能：N型半導體

　　晶體結構：三斜晶系

　　晶胞參數：a = 0.634, b = 0.640 nm, c = 0.645 nm, α = 106.74°, β = 119.03°, γ = 89.97°

　　晶體類型：合成

　　晶體純度：＞99.995%

　　X-ray diffraction on a ReS2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8

　　Powder X-ray diffraction (XRD) of a single crystal ReS2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.

　　Stoichiometric analysis of a single crystal ReS2 by Energy-dispersive X-ray spectroscopy (EDX).

　　Raman spectrum of a single crystal ReS2. Measurement was performed with a 785 nm Raman system at room temperature.