二碲化鈮晶體 NbTe2(Niobium Selenide)

　　晶體尺寸 8毫米

　　電學性能：金屬，半導體（TC ~ 0.7k）

　　晶體結構：單斜晶系，C

　　晶胞參數：a＝1.470 nm，b＝0.364，c＝0.935 nm，α＝γ＝90°，β＝108°

　　晶體類型：合成

　　晶體純度：＞99.995%

　　X-ray diffraction on a NbTe2 single crystal aligned along the (101) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 4 XRD peaks correspond, from left to right, to (h 0 l), with h = l = 1, 2, 3, 4

　　Powder X-ray diffraction (XRD) of a single crystal NbTe2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.

　　Stoichiometric analysis of a single crystal NbTe2 by Energy-dispersive X-ray spectroscopy (EDX).

　　Raman spectrum of a single crystal NbTe2. Measurement was performed with a 785 nm Raman system at room temperature.