這款大范圍掃描開爾文探針系統(tǒng)幫助用戶可以訪問從50mm到350mm的樣品的二維和三維功函數(shù)圖。掃描開爾文探針的功函數(shù)分辨率為1-3meV，探針直徑的空間分辨率為0.05mm，可對功函數(shù)、接觸電位差和伏特電位進(jìn)行可靠、可重復(fù)的測量。
大范圍掃描開爾文探針系統(tǒng)可以選配高性能的光學(xué)/法拉第外殼屏蔽外殼，使其免受不必要的快速變化的環(huán)境條件、電磁干擾，并為我們的環(huán)境壓力光電發(fā)射光譜和表面光電壓附加模塊提供了的平臺。
大范圍掃描開爾文探針系統(tǒng)特色
用開爾文探針測量功函數(shù)
1-3mev的功函數(shù)分辨率
掃描范圍從50毫米到300毫米
掃描分辨率等于針尖直徑
自動高度調(diào)節(jié)
大范圍掃描開爾文探針系統(tǒng)應(yīng)用
防腐，碳鋼，薄膜，太陽能電池，氧化鉬，氧化鋅納米線薄膜，量子點，空穴傳輸，納米顆粒，石墨烯，有機發(fā)光二極管。
大范圍掃描開爾文探針掃描結(jié)果
| 型號 | SKP5050 | ASKP100100 | ASKP200250 | ASKP350350 |
| Tip material / diameter | Standard 2 mm gold tip (0.05 mm available on request) | |||
| Work function resolution | 1 - 3 meV | |||
| Sample scan size | 50 x 50 mm | 100 x 100 mm | 200 x 250 mm | 350 x 350 mm |
| 3D sample area | Square | Square | Square | Square and circular |
| Height control (auto) | 25 mm | 50 mm | 50 mm | 50 mm |
| Visualisation | 3D map of surface potential | |||
| Optical system | Colour camera with zoom lens and monitor | |||
| Oscilloscope | Digital TFT oscilloscope for real time signal | |||
| Test sample | Gold and aluminium test sample | |||
| Faraday enclosure base | 450 x 450 mm | 300 x 300 mm | 450 x 450 mm | 450 x 600 mm |
| Control supplied | PC control with dedicated software for full control of all parameters | |||
| Detection system | Off-null with parasitic capacity rejection | |||
| Warranty | Twelve months | |||
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