二碲化鎢晶體 wte2(tungsten ditelluride)

　　晶體尺寸：10毫米

　　電學性能：半金屬，type ii weyl semil (wsm)

　　晶體結構：斜方晶系 p

　　晶胞參數：a = 0.348 nm, b = 0.625 nm, c = 1.405 nm, α = β = γ = 90°

　　晶體類型：合成

　　晶體純度：＞99.995%

　　屬性：半導體

　　x-ray diffraction on a wte2 single crystal aligned along the (001) plane. xrd was performed at room temperature using a d8 venture bruker. the 5 xrd peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8, 10

　　powder x-ray diffraction (xrd) of a single crystal wte2. x-ray diffraction was performed at room temperature using a d8 venture bruker.

　　stoichiometric analysis of a single crystal wte2 by energy-dispersive x-ray spectroscopy (edx).

　　raman spectrum of a single crystal wte2. measurement was performed with a 785 nm raman system at room temperature.